All-in-one plug-and-play AFM system Famously easy to use All standard operating modes available
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
"For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects, and for demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imaging with great ease. The efficient design of the AFM hardware and the user-friendly software has been ideal for students enrolled in our semester-long AFM course. In addition to high-quality instrumentation, Nanosurf scientists have provided us with fast and outstanding service. I highly recommend using Nanosurf AFMs for educational, training, and research purposes."
To use the NaioAFM, just plug in the power and USB cables, start the user-friendly software, and you're ready to go within minutes! No real setup is required. Check out our overview video to see just how easy this is. Because the NaioAFM comes with a cantilever alignment chip, cantilever exchange is really easy as well, and laser alignment becomes a thing of the past. Watch the cantilever exchange video to see how it's done.
User's experience
Prof. Dr. Nancy Burnham
"The NaioAFM allows new users to acquire meaningful AFM images and data in as little as two hours. In the context of a highly time-constrained course, when perhaps only a total of twelve lab hours are planned, this efficiency is a significant advantage over many other AFMs, for which the time commitment might be two or three times greater."
YouTube tutorial videos
This playlist of 12 videos by Dr. Nancy Burnham shows how the NaioAFM is used in atomic force microscopy classes at the Physics department of the Worcester Polytechnic Institute
NaioAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.
Standard imaging modes
Static Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Electrostatic Force Microscopy (EFM)
Scanning Spreading Resistance Microscopy (SSRM)
Mechanical properties
Force Spectroscopy
Force Modulation
Stiffness and Modulus
Adhesion
Force Mapping
Other measurement modes
Lithography and Nanomanipulation
System dimensions
Applications
NaioAFM application examples
AFM phase image of a polymer blend
This is an example of AFM phase imaging of a polymer blend performed on a NaioAFM. The polymer blend consists of polystyrene (PS) and polybutadiene (PB) deposited on silicon. PS forms islands within the PB matrix.
Phase response shown as color overlay on the 3D topography. Small inclusions of PB can be identified within the PS island by the phase signal. Data processing: Gwyddion Image size: 20 µm
Phase range: 15 degrees
Phase response recorded simultaneously with the topography of the PS-PB blend. Data processing: Gwyddion Cantilever: PPP-NCSTR Image size: 20 µm Height range: 15 degrees
Topography analysis of ePTFE membrane using AFM
The abbreviation ePTFE stands for expanded polytetrafluorethylene, also known as expanded Teflon. The mechanical and medical properties of the material depend strongly on how the Teflon was expanded (mono- or bi-axially) and on the resulting ePTFE network structures. Due to its inert properties inside a human body, ePTFE is often used as an implant material. The empty spaces inside the network structure encourage the growth of soft tissue into such implants, which helps hold the implant in place quickly. There are many different ways to expand PTFE, all leading to different network structures. It is therefore very important to verify that the desired ePTFE structure was obtained after the expansion process.
In this application, we analyzed an ePTFE membrane using AFM. The topography image recorded clearly shows the intricate network structure of the sample. The length of the fibers and the size-distribution of the knots can conveniently be analyzed using the measurement tools integrated in the Nanosurf control software.
Compared to the conventional method used for this analysis - SEM imaging, where a gold film must first be evaporated onto the ePTFE sample in vacuum to make it conductive - AFM is much faster and easier to perform. With the AFM, ePTFE can be measured directly, without any prior treatment of the sample. Additionally, and in contrast to the SEM data, the AFM topographs actually contain quantitative depth information.
AFM force spectroscopy on a polymer blend
AFM-based force spectroscopy was used to characterize a polymer blend consisting of polystyrene (PS) and polybutadiene (PB). Data analysis or an array of force distance curves revealed differences in the material properties of the two components.
3D topography of the PS-PB blend overlaid with the stiffness map derived from the force-distance curves recorded on the same area. The DMT model was used to derive the sample stiffness from the force distance curves.
Data processing: SPIP and Gwyddion
Cantilever: PPP-NCSTR
Image size: 15 µm
Stiffness range: 4 GPa (log scale)
3D topography of the PS-PB blend overlaid with the adhesion map derived from the force-distance curves recorded on the same area. Data processing: SPIP and Gwyddion Cantilever: PPP-NCSTR Image size: 15 µm Max. adhesion force range: 20-40 nN
Example force-distance curves from different areas of the investigated PS-PB blend. The top and bottom panels show force-distance curves recorded on PB (top) and PS (bottom), respectively. The arrows in the topography image in the middle panel indicate the location where the force-distance curves were recorded. As indicated in the top panel, different information can be extracted from a force-distance curve: slope of the contact region, sample indentiation, max. adhesion force, and the work required for detachment. The slope itself a rough estimate of the sample stiffness, i.e. the PB is much softer than PS because the slope of the contact part is shallower (see red triangles). Analysis of the force distance curve using a contact mechanics model, such as the DMT model, reveals the actual stiffness of the sample.
NaioAFM image gallery
AFM phase image of a polymer blend
Topography analysis of ePTFE membrane using AFM
Magnesium fluoride coating
Tissue samples
Polycarbonate gratings
Airplane Wing Coating
Treated Nanofibers
CD
Copolymer
Nanosphere Lithography
Polymeric glass
Lithography on Titanium
Dynamic mode AFM on pentacene film on TiO2
Morphology analysis of paper
Contact mode AFM of polished ceramic plate used in dentistry
Dynamic mode AFM of human hair
AFM images of gold film on ceramic grains
AFM image of butterfly wings
Static force AFM of stainless steel
Options & Accessories
NaioAFM options and accessories
Side view camera
The USB digital sideview camera has a 1280 x 1024 pixel sensor with 2 x 2 mm field of view. The camera is mounted on top of the NaioAFM and displays a side view image in the control software. This helps see the distance between the cantilever and the sample during the manual and automatic approach.
Isostage 300
Vibration-free measurements with the Nanosurf Isostage
Mode Kits
Dynamic force mode kit
EFM mode kit
Force modulation mode kit
Phase imaging mode kit
Standard lithography kit
Standard MFM mode kit
Standard spectroscopy mode kit
Static force mode kit
AFM extended sample kit
The AFM extended sample kit includes 10 samples from various disciplines, along with sample handling tools. The kit is accompanied by an extensive manual that serves both as a support for curriculum development and as an in-class guide to each investigation.
Software
Control software
The control software for Nanosurf AFMs is an intuitive platform made for performing your AFM measurements efficiently and easily. Our Service team and software engineers are constantly developing and implementing new features and enhancements to further improve the user experience. We regularly publish new and improved versions, which you can download for free. You can install the software on as many computers as you wish to analyze your data.
Free lifetime updates: download all software updates for free
All software updates for Nanosurf control software are free of charge. Our software team is constantly working on new features and improvements to make the user experience better, more intuitive and more efficient.
Software features
Automatic/parameter-free frequency tuning based on cantilever characteristics
Simply choose the cantilever you are using, and the system automatically performs the frequency sweep prior to approaching the sample. No manual setting of parameters is required.
Distance measuring tools: measure the distance between points or lines, the height of features, and more
A selection of different measuring tools allow you to accurately measure angles and distances directly on the acquired measurement image.
Determine the distance between two points or between two parallel lines to make very precise measurement (as shown in the video).
Scripting interface: Python package for COM interface
Python API for data acquisition and control of Nanosurf atomic force microscopes
At Nanosurf we realize that leading researchers are often interested in modifying the standard routines of an instrument, or else everyone would be doing the same thing with the same hardware.
Sometimes there are also application-specific routines, the scope of which we cannot predict and program ourselves. This is why we developed the Nanosurf Scripting Interface.
This interface can be used for automation of routine tasks and for creating new experiments. It gives the users full control over our user interface, and some control over the hardware functionality.
The Nanosurf control software publishes its functionality via the COM interface, by running an instance of COM Automation Server. COM Automation Clients can ask the server during the runtime about its functions and access them. These functions can be accessed through most modern programming languages: Python, C++, C#, VBS, Matlab, JS, LabView, etc.
For ease of use, Nanosurf has created a Python API for its COM interface. We chose Python as our API language, because of its ease of use and learning, popularity and universality, and because of number of data and image processing libraries used in academia and industry.
The Nanosurf Python package can be downloaded and installed from PyPI using pip:
See how to take control over the GUI settings in Python. The video shows the most basic actions, like changing the imaging mode, choosing the right cantilever, adjusting image parameters
and the PID settings. See how to automatically find the working frequency, start the approach, start scanning, and save the data.
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More convenient usability features:
Spectroscopy wizard: follow easy steps to set up spectroscopy measurements
One software UI for all scan heads: no additional learning curve if you use multiple Nanosurf AFM systems
Automated deflection calibration
UI layouts for beginners and advanced users
Highly configurable graph area with mode-dependent auto-layout: the software automatically shows the relevant graphs and information
Easy file handling with comfort features: auto apply naming conventions, Windows Explorer integration, image gallery, bulk renaming.
Includes a powerful scripting interface: automate and extend capabilities according to your needs. Compatible with most programming environments (e.g. LabView, Python, MatLab, C++, Java, and more)
