LensAFM — Extend the resolution of your optical microscope
Mountable on virtually any optical microscope or 3D optical profilometer Extend your resolution capabilities by a factor of up to 100 Combine optical and AFM techniques
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
"The unique combination of compact design, optical access, and intuitive operation of the LensAFM made it the perfect platform for our instrument development. We believe that much of the success of our project has been achieved through the excellent communication that we have enjoyed between ourselves, Nanosurf, their UK distributor Windsor Scientific, and AFM probe manufacturer Nanosensors. We now look forward to future developments with the LensAFM to optically probe magnetic materials deep into the nanoscale."
Dr. Paul S. Keatley
Senior Experimental Officer (SEO)
Exeter Time Resolved Magnetism Facility
University of Exeter, UK More on Dr. Keatley's work
Download the LensAFM Brochure
Perform AFM measurements with the instruments you are used to
In an ever increasing number of situations, researchers want to combine optical and atomic force microscopy techniques. The ease of use, screening capability and (lack of) sample preparation requirements of optical microscopes is almost unparalleled. However, sometimes a 100x objective is not enough and you would like to have a closer look at some small features that go beyond the resolution of the instrument. In a regular laboratory setting you would require two dedicated instruments and it would be necessary to transfer the sample from one device to the other. With the LensAFM this is not the case. With its exceptionally small design and clever mounting mechanism all you need to do is rotate the turret on your optical microscope or profilometer and run the scan.
The LensAFM integrates perfectly into your workflow: upon mounting it on your optical microscope's turret — like a regular objective lens — you screen the sample with normal objectives to find areas of interest. Subsequently, the area of interest is readily found again using the integrated 8x optical lens, and you can then perform your AFM measurement to get higher resolution 3D information: work in the way you are used to, but with a huge boost in resolution and capabilities.
The LensAFM has a quick release mechanism to easily mount and unmount the LensAFM to and from the turret. The kinematic mounting guarantees that you will replace it with better than 10 µm accuracy. Alignment grooves on the chip mount additionally ensure that the tip of the next cantilever is within 4 µm of the same position allowing to find the same feature again, even after a cantilever exchange. And thanks to these alignment grooves, you don't even have to perform a laser alignment on the cantilever, saving additional time.
The LensAFM brings all these measurement capabilities to your optical microscope, without rethinking of your whole workflow. Watch the video to see for yourself how easy it is to boost your capabilities.
Boost the capabilities of your optical microscope
Since the resolution of optical microscopy is limited by the wavelength of light, there is a barrier in the resolution you can achieve with your optical system. In an ever increasing number of applications, this calls for the combination of optical and atomic force microscopy. In addition, AFM overcomes problems characterizing transparent samples or samples otherwise difficult to assess optically. But not only the topography of a sample is of interest: AFM also allows knowledge of other material properties to be acquired, e.g. surface roughness, hardness variations, magnetism, or electrical conductance/resistance.
LensAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please contact us.
Standard imaging modes
Static Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Electrostatic Force Microscopy (EFM)
Scanning Spreading Resistance Microscopy (SSRM)
Mechanical properties
Force Modulation
Force Spectroscopy
Force Mapping
Other measurement modes
Lithography and Nanomanipulation
Scan head dimensions
Applications
Typical LensAFM application example
Defects in hard-coated metal surface
The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments, as illustrated by the three images below.
Defects in a hard-coated metal surface as observed through a 100× microscope objective lens (NA 0.9). The nature and exact structure remain unclear.
The same area as observed through the LensAFM‘s built-in 8× objective lens. The AFM cantilever is visible in the optical image and allows easy positioning of the sample before measurement.
AFM topography of the same defect recorded by the LensAFM. 3D data of the area clearly identify the defect as a hole in the coating layer, partially filled with debris.
LensAFM image gallery
Magnetic force microscopy on polished stainless steel
AFM force spectroscopy on a polymer blend
AFM phase image of a polymer blend
Topography analysis of ePTFE membrane using AFM
Magnesium fluoride coating
Tissue samples
Polycarbonate gratings
Airplane Wing Coating
Treated Nanofibers
Photoresin Interference Grid
CD
Copolymer
Nanosphere Lithography
Polymeric glass
Lithography on Titanium
Dynamic mode AFM on pentacene film on TiO2
Morphology analysis of paper
Contact mode AFM of polished ceramic plate used in dentistry
Dynamic mode AFM of human hair
MFM of bits on a harddisk
AFM images of gold film on ceramic grains
AFM for dental implants
AFM image of butterfly wings
Static force AFM of stainless steel
Options & Accessories
LensAFM options and accessories
Easy mounting on virtually any upright optical microscope or 3D optical profilometer
The LensAFM mounts just like a standard objective lens, and is compatible with all commonly used optical microscopes and 3D profilometers (Zeiss, Olympus, Leica, Nikon, Mitutoyo) via the wide variety of mounting adapters available.
Zeiss / Olympus BF RMS W20.32 x 0.706, 45 mm
Zeiss DF M27 x 0.75, 45 mm
Olympus DF RMS W26x0.706, 45mm
Leica M25x0.75, 45 mm
Nikon M25x0.75, 60 mm
Leica M32x0.75, 45 mm
Nikon M32x0.75, 60 mm
Mitutoyo RMS W26x0.706, 95 mm
Software
Control software
The control software for Nanosurf AFMs is an intuitive platform made for performing your AFM measurements efficiently and easily. Our Service team and software engineers are constantly developing and implementing new features and enhancements to further improve the user experience. We regularly publish new and improved versions, which you can download for free. You can install the software on as many computers as you wish to analyze your data.
Free lifetime updates: download all software updates for free
All software updates for Nanosurf control software are free of charge. Our software team is constantly working on new features and improvements to make the user experience better, more intuitive and more efficient.
Software features
Automatic/parameter-free frequency tuning based on cantilever characteristics
Simply choose the cantilever you are using, and the system automatically performs the frequency sweep prior to approaching the sample. No manual setting of parameters is required.
Distance measuring tools: measure the distance between points or lines, the height of features, and more
A selection of different measuring tools allow you to accurately measure angles and distances directly on the acquired measurement image.
Determine the distance between two points or between two parallel lines to make very precise measurement (as shown in the video).
Integrated stage control for various motorized stages
The software lets you control your motorized stage out of the box. Load your stage's configuration file and you are ready to move the stage out of the software, either using arrow buttons, or by entering precise cantilever positions on the sample.
More convenient usability features:
Spectroscopy wizard: follow easy steps to set up spectroscopy measurements
One software UI for all scan heads: no additional learning curve if you use multiple Nanosurf AFM systems
Automated deflection calibration
UI layouts for beginners and advanced users
Highly configurable graph area with mode-dependent auto-layout: the software automatically shows the relevant graphs and information
Easy file handling with comfort features: auto apply naming conventions, Windows Explorer integration, image gallery, bulk renaming.
Includes a powerful scripting interface: automate and extend capabilities according to your needs. Compatible with most programming environments (e.g. LabView, Python, MatLab, C++, Java, and more)