The best value research AFM
The best value research AFM
Research AFM with a competitive price tag
Integrated system with small footprint
33 modes and functions
The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, the CoreAFM is equipped to perform AFM at its best.
The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and airflow shielding in a single all-in-one unit results in a complete AFM system with an unparalleled compact footprint. The system comes with a fully digital 24-bit controller developed specifically for the CoreAFM scanhead. All the essential functions of modern AFM are integral components of the CoreAFM system; all you need to do to take the CoreAFM into operation is connect the controller, and plug in power and USB.
Seamlessly extendable functionality
Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended. Advanced AFM modes and functionality like sample heating, environmental control, scripting, and many others can easily be added to your CoreAFM. For details and dependencies, see the overview graphic.
Easy setup and handling
See for yourself how easy it is to prepare and operate the CoreAFM. Watch the video for a demonstration of the main features, and a brief tutorial on how to perform a measurement using this system.
Deeper system integration of the Isostage is reflected in the unique Spike-Guard, which eliminates glitches during imaging. Although the Isostage is an active vibration isolation system, glitches can still occur when distortions are too severe. Spike-Guard detects such anomalies and rescans the line for a distortion-free image.
Powerful and versatile
State of the art electronics with 24-bit ADC and DAC ensure high-resolution XYZ driving of the 100×100×12 µm scanner and allow for low-noise force detection limited only by the cantilever. Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended.
CoreAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.
Standard imaging modes
Static Force Mode
Lateral Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic Force Microscopy
Conductive AFM (C-AFM)
Piezoelectric Force Microscopy (PFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Stiffness and Modulus
Unfolding and Stretching
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
Included measurement modes
The CoreAFM can perform static force, dynamic force, phase imaging, MFM, lateral force, force modulation, standard spectroscopy, and standard lithography out of the box. You can however enhance your measurement experience with CoreAFM mode kits.
Included standard mode kits
By default, the CoreAFM comes with the static force mode kit, dynamic force mode kit, and phase imaging mode kit to get you started right away. Depending on the measurement mode, a mode kit may include samples, suitable cantilevers, accessories, or a combination thereof.
Additional standard mode kits
Additional standard-level mode kits that can be acquired separately are the standard spectroscopy kit, standard lithography kit, standard MFM mode kit, standard liquid mode kit, lateral force mode kit, and force modulation mode kit.
|Max. scan range (XY)||100 µm(1)||< 5 nm flatness|
|Max. height range (Z)||12 µm(2)||closed loop|
|Detector noise (RMS)||typ. 60 pm||max. 100 pm|
|Sensor noise (RMS)||typ. 180 pm||max. 250 pm|
|Dynamic noise (RMS)||typ. 40 pm||max. 70 pm|
|Static noise (RMS)||typ. 100 pm||max. 200 pm|
|(1) Manufacturing tolerances ± 5%|
(2) Manufacturing tolerances ± 10%
|Scan control and inputs||24-bit ADC/DAC||200 kHz|
|Digital lock-in (2×)||16-bit ADC/DAC||20 MHz|
|User in/out, Excitation in||24-bit ADC/DAC||5 MHz, 10 V|
|Digital sync||2-bit line/frame sync out||5 V, TTL|
|Thermal tuning||10 Hz – 2 MHz|
|FPGA, 32-bit CPU, 256 MB RAM||programmable||USB 2.0|
|Width||min. 20 μm|
|Length||min. 40 μm|
|Reflective coating||Reflective coating recommended|
|Liquid measurements||Yes, with gold coating|
|Alignment grooves||Required by default
Special cantilever holders without alignment grooves are available
|Resonance frequency dynamic mode||< 4 MHz|
|Cantilever shape||Single rectangular cantilevers and multilever cantilevers (depending on scan head version and cantilever holder)|
|Chip thickness||300 μm, 500 μm or 600 μm depending on cantilever holder|