Flex-Mount — The essential AFM for custom integration
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is an AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized translation stages and is thus able to characterize the surface of samples with weights and dimensions virtually no other AFM system can handle.
Proven performance and reliability Automated measurements for additional ease of use Customizable stages to handle large samples of any shape and size
Practical details that really matter in daily use
Cantilever holders with magnetic attachment to the scan head make the task of replacing cantilevers an easy one.
The same cantilevers holders also include alignment structures for use with cantilevers containing alignment grooves. This provides micrometer repositioning accuracy, circumventing laser alignment and allowing you to find the same sample features after cantilever exchange.
The Flex-Mount also includes an integrated top view and side view camera, which are of great help during sample approach and positioining, allowing you to precisely align the tip with the feature of interest on the sample.
Top view
Side view
Precision and performance
The Flex-Mount uses a linear electromagnetic scanner for XY movement. This scanner delivers an average linearity deviation of less than 0.1% over the full scan range, top-ranking on the AFM market. The Z-axis is piezo-driven, with a position sensor that enables closed-loop operation. A sensitive cantilever detection system can measure well into the MHz frequency range. The scan head is connected to the full-featured, 24-bit C3000i controller with digital feedback and 2 dual-channel lock-in amplifiers.
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.
Standard imaging modes
Static Force Mode
Lateral Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Thermal imaging modes
Scanning Thermal Microscopy (SThM)
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Piezoelectric Force Microscopy (PFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Scanning Spreading Resistance Microscopy (SSRM)
Mechanical properties
Force Spectroscopy
Stiffness and Modulus
Adhesion
Unfolding and Stretching
Force Mapping
Other measurement modes
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
Integration examples
Integration examples
Total freedom with Nanosurf custom sample stages
Measure irregular samples just as easily as regularly shaped, planar and non-planar samples. Let us build the ideal automated solution for you, or integrate the Flex-Mount with your existing measurement stages. The Nanosurf portfolio has many options for both software and hardware integration. We're happy to be of assistance!
This video shows the complex coordinated stage tilting, rotating and translation movements possible to allow AFM measurements on any plane or edge of a difficult sample/shape.
This video shows the tilting, rotating and translation movements required to measure any area on a regularly formed concave sample.
Motorized XYZΦ translation stage for extra large samples
Description
Specification
Max. Traverse path X/Y/Z/Φ:
230/485/20 mm / 360°
Step size X/Y/Z/Φ:
0.5/0.5/0.5 µm / 0.001°
Step size X/Y/Z/Φ:
0.5/0.5/0.5 µm / 0.001°
Repositioning accuracy:
± 1/1/1 µm / 0.001°
Absolute accuracy:
± 15 µm
Max. velocity:
30/30/3 mm/s / 7°/s
Sample platform size:
⌀500 mm
Sample size:
⌀500 mm × 80 mm
Sample weight:
max. 20 kg
Stage size:
1350 mm × 950 mm × 1360 mm
Stage weight:
1300 kg
Stage technology:
Linear motors, spindle-stepper motor, harmonic drive, air bearings
Noise level:
< 40 pm
Motorized XYZ translation stage
Description
Specification
Max. Traverse path X/Y:
235 mm
Motorized Z-travel:
50 mm
Sample platform size:
240 mm × 240 mm
Resolution X/Y:
0.1 µm
Repositioning accuracy X/Y:
1 µm
Max. sample size:
240 mm × 240 mm × 45 mm
Stage size:
490 mm × 530 mm × 350 mm
Stage weight:
Approx. 60 kg
Noise level:
< 35 pm
Manual translation stage
Description
Specification
Sample platform size X/Y:
400 mm × 300 mm
Tip – rear wall distance:
113 mm
Max. sample size:
400 mm × 300 mm × 105 mm
Stage size:
400 × 400 × 400 mm
Stage weight:
Approx. 55 kg
Options & Accessories
Flex-Mount options and accessories
Standard sample holder
Samples up to 100 mm in diameter, central magnet to hold small samples on pucks, clips to hold larger samples.
Petri dish holder
Holds petri dishes of 35 or 50 mm diameter and height up to 10 mm.
Heater sample holder
Heats samples up to 250 °C. Needs TEC controller CH1.
Cooling & heating sample holder
Temperature range of -35 °C to 180 °C. Needs TEC controller CH1, pump and temperature reference unit.
TEC contoller CH1
Temperature monitoring and control, temperature stability < 0.05 °C.
Pump and temperature control unit
Used with cooling & heating sample holder. Includes a pump and temperature control unit for the circulating coolant.
C-AFM sample holder
Sample holder for advanced conductive AFM option. Current range of ± 25 nA with a sensitivity of 108 V/A. Current noise 3 pA at 4 kHz bandwidth.
150 µm z-stage
Z-range extension of up to 150 µm for long range force spectroscopy experiments. For petri dishes of 35 mm diameter and 50 mm diameter.
Variable magnetic field sample holder
Variable in-plane magnetic field, integrated Hall sensor, Max. field – 720 mT (2 mm gap), Filed resolution – 0.1 mT, Sample size - up to 10 x 10 mm2.
Digital inverted microscope option
The DIMO can be integrated with Isostage 300, SMA optical port for illumination, Motorized centering and focus, Nikon objective, Fluorescence option with a fiber coupled light source.
EC cell
For electrochemical experiments, PEEK or PVDF EC cell in a stainless-steel frame. Built-in electrode and tubing feedthroughs.
Environmental control chamber
For sample measurements under controlled environments. Expanding sealing membrane. Gas inlet and outlet.
Mountable scan head with tip scanner; Flexure-based electro-magnetically actuated XY-scanner with superb linearity; Piezo-based Z-actuator; Optical Z-position sensor; Closed loop Z-control
Laser / detector
High-speed, low-noise 4-quadrant photodiode detector; near-infrared SLD; laser on/off through software and scan head tilting; optical filters for use with optical microscope phase contrast and fluorescence
Approach
50 mm z-stage with step-by-step approach; software-driven motorized coarse movement and automated final approach
Cantilever holder
Automatic self-alignment for cantilevers with alignment grooves. Manual laser adjustment possible for special cantilevers.
Sample observation
Top and side view in air and liquid; White LEDs (brightness 0–100%); Axial illumination for top view
Operating modes
Static Force, Lateral Force, Dynamic Force, Phase Contrast, MFM, EFM, KPFM, Piezo Force, Force Modulation, Scanning Thermal, Spreading Resistance, Multiple Spectroscopy modes, Lithography and Manipulation modes. Some modes may require additional hardware and/or activating of the respective C3000 controller options.
Security out option (for stage controllers)
Security mechanism to prevent severe scan head crash and to protect the sample. Includes table-top operating unit with emergency kill switch and manual security override for 3rd party stage control units by LSTEP or SmarAct.
Specifications
Flex-Mount scan head specifications
Sample size
Stage-dependent
Motorized approach range (at tip position; standard Z-stage)
50 mm
Max. scan range (XY)
100 µm (1)
Max. height range (Z)
10 µm (2)
XY-linearity mean error
< 0.1%
XY-flatness at maximum scan range
typ. 5 nm
Detector bandwidth
DC - 4 MHz
Detector noise level (RMS)
typ. 60 pm / max. 100 pm (3, 4)
Z-sensor noise level (RMS)
typ. 180 pm / max. 200 pm (3)
Z-measurement noise level (RMS, static mode in air)
typ. 100 pm / max. 200 pm
Z-measurement noise level (RMS, dynamic mode in air)
typ. 35 pm / max. 50 pm
Scan head dimensions incl. Z-stage
181 mm x 130 mm x 171 mm
Scan head weight
1.25 kg
(1) Manufacturing tolerances ± 5%
(2) Manufacturing tolerances ± 10%
(3) Measured at 2 kHz
(4) Measured with XYContr cantilever
C3000i controller — Core hardware specifications
X/Y/Z-axis scan and position controller
3× 24-bit DAC (200 kHz)
X/Y/Z-axis position measurement
1× 24-bit ADC (200 kHz)
Excitation & modulation outputs
2× 16-bit DAC (20 MHz)
Analog signal input bandwidth
0–5 MHz
Main input signal capturing
2× 16-bit ADC (20 MHz)
2× 24-bit ADC (200 kHz)
Additional user signal outputs
1× 24-bit ADC (200 kHz)
Digital synchronization
Sync Out 1/2: digital outputs, signal range 0/5V TTL pulses
FPGA module and embedded processor
ALTERA FPGA, 32-bit NIOS-CPU, 80 MHz, 256 MB RAM, multitasking OS
Communication
USB 2.0 Hi-Speed to PC and scan head interface
System clock
Internal quartz (10 MHz) or external clock
Power
90–240 V AC, 70 W, 50/60Hz
Cantilever specifications and requirements
Width
min. 20 μm
Length
min. 40 μm
Reflective coating
Reflective coating recommended
Liquid measurements
Yes, with gold coating
Alignment grooves
Required by default
Special cantilever holders without alignment grooves are available
Resonance frequency dynamic mode Easyscan 2 Controller
15 kHz to 350 kHz
Resonance frequency dynamic mode C3000 Controller
< 4 MHz
Cantilever shape
Single rectangular cantilevers and multilever cantilevers (depending on scan head version and cantilever holder)
Chip thickness
300 μm, 500 μm or 600 μm depending on cantilever holder
