Overview
Flex-Mount — The essential AFM for custom integration
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is an AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized translation stages and is thus able to characterize the surface of samples with weights and dimensions virtually no other AFM system can handle.
Proven performance and reliability
Automated measurements for additional ease of use
Customizable stages to handle large samples of any shape and size
Download the Flex-Mount brochure
Practical details that really matter in daily use
Cantilever holders with magnetic attachment to the scan head make the task of replacing cantilevers an easy one.
The same cantilevers holders also include alignment structures for use with cantilevers containing alignment grooves. This provides micrometer repositioning accuracy, circumventing laser alignment and allowing you to find the same sample features after cantilever exchange.
The Flex-Mount also includes an integrated top view and side view camera, which are of great help during sample approach and positioining, allowing you to precisely align the tip with the feature of interest on the sample.
Top view
Side view
Precision and performance
The Flex-Mount uses a linear electromagnetic scanner for XY movement. This scanner delivers an average linearity deviation of less than 0.1% over the full scan range, top-ranking on the AFM market. The Z-axis is piezo-driven, with a position sensor that enables closed-loop operation. A sensitive cantilever detection system can measure well into the MHz frequency range. The scan head is connected to the full-featured, 24-bit C3000i controller with digital feedback and 2 dual-channel lock-in amplifiers.
Glass roughness
AFM topography of glass; overview
(scan size: 5 µm × 5 µm)
AFM topography of glass; details
(scan size: 1 µm × 1 µm)
Histogram of the topography data.
Sa = 313.10 pm, Sq = 393.66 pm, Sy = 4420 pm, Sp = 1981.7 pm, Sv = -2468.6 pm, Sm = -9.313 fm
Silicon wafer roughness
AFM topography of a silicon wafer; overview
(scan size: 5 µm × 5 µm)
AFM topography of a silicon wafer; details
(scan size: 1 µm × 1 µm)
Histogram of the topography data.
Sa = 318.46 pm, Sq = 397.54 pm, Sy = 3335 pm, Sp = 1685.2 pm, Sv = -1670.4 pm, Sm = -19.499 fm
Steps of Strontium Titanate
Topography showing steps of strontium titanate
(scan size: 1.1 µm × 1.1 µm)
Section profile and height distribution
Scan head dimensions
All dimensions in mm.
AFM Modes
Flex-Mount imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.
Standard imaging modes
Static Force Mode
Lateral Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Thermal imaging modes
Scanning Thermal Microscopy (SThM)
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Piezoelectric Force Microscopy (PFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Scanning Spreading Resistance Microscopy (SSRM)
Mechanical properties
Force Spectroscopy
Stiffness and Modulus
Adhesion
Unfolding and Stretching
Force Mapping
Other measurement modes
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
Integration examples
Integration examples
Total freedom with Nanosurf custom sample stages
Measure irregular samples just as easily as regularly shaped, planar and non-planar samples. Let us build the ideal automated solution for you, or integrate the Flex-Mount with your existing measurement stages. The Nanosurf portfolio has many options for both software and hardware integration.
We're happy to be of assistance!
This video shows the complex coordinated stage tilting, rotating and translation movements possible to allow AFM measurements on any plane or edge of a difficult sample/shape.
This video shows the tilting, rotating and translation movements required to measure any area on a regularly formed concave sample.
Motorized XYZΦ translation stage for extra large samples
| Description |
Specification |
| Max. Traverse path X/Y/Z/Φ: |
230/485/20 mm / 360°
|
| Step size X/Y/Z/Φ: |
0.5/0.5/0.5 µm / 0.001° |
| Step size X/Y/Z/Φ: |
0.5/0.5/0.5 µm / 0.001° |
| Repositioning accuracy: |
± 1/1/1 µm / 0.001° |
| Absolute accuracy: |
± 15 µm |
| Max. velocity: |
30/30/3 mm/s / 7°/s |
| Sample platform size: |
⌀500 mm |
| Sample size: |
⌀500 mm × 80 mm |
| Sample weight: |
max. 20 kg |
| Stage size: |
1350 mm × 950 mm × 1360 mm |
| Stage weight: |
1300 kg |
| Stage technology: |
Linear motors, spindle-stepper motor, harmonic drive, air bearings
|
| Noise level: |
< 40 pm |
Motorized XYZ translation stage
| Description |
Specification |
| Max. Traverse path X/Y: |
235 mm
|
| Motorized Z-travel: |
50 mm |
| Sample platform size: |
240 mm × 240 mm |
| Resolution X/Y: |
0.1 µm |
| Repositioning accuracy X/Y: |
1 µm |
| Max. sample size: |
240 mm × 240 mm × 45 mm |
| Stage size: |
490 mm × 530 mm × 350 mm |
| Stage weight: |
Approx. 60 kg |
| Noise level: |
< 35 pm |
Manual translation stage
| Description |
Specification |
| Sample platform size X/Y: |
400 mm × 300 mm |
| Tip – rear wall distance: |
113 mm |
| Max. sample size: |
400 mm × 300 mm × 105 mm |
| Stage size: |
400 × 400 × 400 mm |
| Stage weight: |
Approx. 55 kg |
Options & Accessories
Flex-Mount options and accessories
Standard sample holder
Samples up to 100 mm in diameter, central magnet to hold small samples on pucks, clips to hold larger samples.
Petri dish holder
Holds petri dishes of 35 or 50 mm diameter and height up to 10 mm.
Heater sample holder
Heats samples up to 250 °C. Needs TEC controller CH1.
Cooling & heating sample holder
Temperature range of -35 °C to 180 °C. Needs TEC controller CH1, pump and temperature reference unit.
TEC contoller CH1
Temperature monitoring and control, temperature stability < 0.05 °C.
Pump and temperature control unit
Used with cooling & heating sample holder. Includes a pump and temperature control unit for the circulating coolant.
C-AFM sample holder
Sample holder for advanced conductive AFM option. Current range of ± 25 nA with a sensitivity of 108 V/A. Current noise 3 pA at 4 kHz bandwidth.
150 µm z-stage
Z-range extension of up to 150 µm for long range force spectroscopy experiments. For petri dishes of 35 mm diameter and 50 mm diameter.
Variable magnetic field sample holder
Variable in-plane magnetic field, integrated Hall sensor, Max. field – 720 mT (2 mm gap), Filed resolution – 0.1 mT, Sample size - up to 10 x 10 mm2.
Digital inverted microscope option
The DIMO can be integrated with Isostage 300, SMA optical port for illumination, Motorized centering and focus, Nikon objective, Fluorescence option with a fiber coupled light source.
EC cell
For electrochemical experiments, PEEK or PVDF EC cell in a stainless-steel frame. Built-in electrode and tubing feedthroughs.
Environmental control chamber
For sample measurements under controlled environments. Expanding sealing membrane. Gas inlet and outlet.
Samples & mode kits
Mode Kits
- FlexAFM standard conductive AFM mode option
- Dynamic force mode kit
- EFM mode kit
- Force modulation mode kit
- Lateral force mode kit
- Phase imaging mode kit
- Standard liquid mode kit
- Standard lithography kit
- Standard MFM mode kit
- Standard spectroscopy mode kit
- Static force mode kit
View in webshop
Cantilever holders
- Cantilever holder liquid/air flat
- Cantilever holder liquid/air flat conductive
- Cantilever holder liquid/air flat grooveless 0.3 mm
- Cantilever holder liquid/air flat grooveless 0.6 mm
