The flexible research AFM
Overview
FlexAFM — The flexible research AFM
Modular concept to exactly match your needs
Compatible with inverted microscopes
Flat and linear scanning thanks to flexure-based scanner technology
True flexibility with exchangeable cantilever holders for specialized tasks
Scanning capabilities in liquid and advanced measurement modes
Suitable for any sample size
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible AFMs ever, allowing a large variety of research applications to be handled with ease.
In combination with the powerful C3000i controller, complex material characterizations are possible.
Download the FlexAFM Brochure
Get a printable PDF of the FlexAFM brochure.


We have been using the FlexAFM system for the last couple of years. The ease of use and its robustness helped us publish a number of articles in high impact journals. I'm very pleased with the performance of your AFM system and would highly recommend your systems for other customers in India and abroad. The technical support from Switzerland as well as local support in India is found to be very satisfactory.
Department of Materials Science & Engineering
INDIAN INSTITUTE OF TECHNOLOGY DELHI
Practical details that really matter in daily use
Cantilever holders with alignment structures are available for use with cantilevers containing alignment grooves. This provides micrometer repositioning accuracy, circumventing laser alignment and allowing you to find the same sample features again and again. Cantilevers enter the image from top to bottom, so sample orientation is always the same, no matter whether you look by eye, CCD camera, or AFM (when scanned at the default scan angle).



FlexAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us.
Standard imaging modes
Static Force Mode
Lateral Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Thermal imaging modes
Scanning Thermal Microscopy (SThM)
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Surface Potential
Piezoelectric Force Microscopy (PFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Scanning Spreading Resistance Microscopy (SSRM)
Mechanical properties
Force Spectroscopy
Force Modulation
Stiffness and Modulus
Adhesion
Unfolding and Stretching
Force Mapping
Other measurement modes
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
System specifications*
FlexAFM 5 scan head specifications with C3000i controller | 100-µm scan head | 10-µm scan head |
---|---|---|
Sample size | Unlimited without sample stage 100 mm on sample stage | |
Maximum Petri dish height (fluid level) | 9 mm (6 mm) | |
Manual height adjustment range | 6 mm | |
Motorized approach range (at tip position) | 2 mm | |
Max. scan range (XY) | 100 µm1 | 10 µm1 |
Max. height range (Z) | 10 µm2 | 3 µm1 |
XY-linearity mean error | < 0.1% | |
XY-flatness at maximum scan range | typ. 5 nm | typ. 1 nm |
Detector bandwidth | DC - 4 MHz | |
Detector noise level (RMS) | typ. 60 pm / max. 100 pm (3, 4) | |
Z-sensor noise level (RMS) | typ. 180 pm / max. 200 pm (3) | |
Z-measurement noise level (RMS, static mode in air) | typ. 100 pm / max. 200 pm | |
Z-measurement noise level (RMS, dynamic mode in air) | typ. 35 pm / max. 50 pm | |
Scan head dimensions | 413 x 158 x 53 mm | |
Scan head weight | 1.25 kg | |
(1) Manufacturing tolerances ± 5% (2) Manufacturing tolerances ± 10% (3) Measured at 2 kHz (4) Measured with XYContr cantilever |
C3000i controller — Core hardware specifications | |
---|---|
X/Y/Z-axis scan and position controller | 3× 24-bit DAC (200 kHz) |
X/Y/Z-axis position measurement | 1× 24-bit ADC (200 kHz) |
Excitation & modulation outputs | 2× 16-bit DAC (20 MHz) |
Analog signal input bandwidth | 0–5 MHz |
Main input signal capturing | 2× 16-bit ADC (20 MHz) 2× 24-bit ADC (200 kHz) |
Additional user signal outputs | 1× 24-bit ADC (200 kHz) |
Digital synchronization | Sync Out 1/2: digital outputs, signal range 0/5V TTL pulses |
FPGA module and embedded processor | ALTERA FPGA, 32-bit NIOS-CPU, 80 MHz, 256 MB RAM, multitasking OS |
Communication | USB 2.0 Hi-Speed to PC and scan head interface |
System clock | Internal quarts (10 MHz) or external clock |
Power | 90–240 V AC, 70 W, 50/60Hz |
Cantilever requirements | |
---|---|
Width | min. 20 μm |
Length | min. 40 μm |
Reflective coating | Reflective coating recommended |
Liquid measurements | Yes, with gold coating |
Alignment grooves | Required by default Special cantilever holders without alignment grooves are available |
Resonance frequency dynamic mode Easyscan 2 Controller | 15 kHz to 350 kHz |
Resonance frequency dynamic mode C3000 Controller | < 4 MHz |
Cantilever shape | Single rectangular cantilevers and multilever cantilevers (depending on scan head version and cantilever holder) |
Chip thickness | 300 μm, 500 μm or 600 μm depending on cantilever holder |
Scan head dimensions

*All specifications are subject to change. Please contact sales for confirmed values.