Flex-Axiom — AFM for materials research

Overview

The most flexible atomic force microscope for materials research

Most flexible AFM system for materials research
Modular concept to exactly match your needs
Suitable for any sample size

For success in materials research studies, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible AFMs ever, allowing a large variety of materials research applications to be handled with ease. In combination with the powerful C3000i controller, complex material characterizations are possible.

Used by hundreds of researchers for many applications

The Flex-Axiom is your reliable tool for topographical and metrological imaging of samples in both air and liquid. But the Flex-Axiom goes beyond topography, for example with advanced mechanical, electrical, or magnetic characterization. The system has also been successfully used for local sample manipulation.

topography, KPFM and MFM on stainless steel sample

Topography, KPFM, and MFM images of the same area of a stainless steel sample

The precision and performance you need for your research

The Flex-Axiom uses an extremely linear electromagnetic scanner for XY movement. This scanner delivers an average linearity deviation of less than 0.1% over the full scan range, top-ranking on the AFM market. The Z-axis is piezo-driven, with a position sensor that enables closed-loop operation. A sensitive cantilever detection system can measure well into the MHz frequency range. The scan head is connected to the full-featured, 24-bit C3000i controller with digital feedback and 2 dual-channel lock-in amplifiers.

Imaging of single and multiple pyrene nanosheets and height analysis with sub-nanometer accuracy. Data courtesy: Mykhailo Vybornyi, University of Berne, Switzerland

Perfect for use inside a glovebox

Harvard's Philip Kim investigates mesoscale transport phenomena of low dimensional nanoscale materials with the Nanosurf Flex-Axiom AFM installed in an MBraun Glovebox MB-200B.

The setup allows sample preparation inside the glovebox
No sample contamination with water or oxygen allows measurement of electrical transport properties
Cable feedthrough done by MBraun; 2 sets of cables included
MinusK and IsoStage vibration isolation

Flex-Axiom imaging modes

This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us.

Standard imaging modes

Static Force Mode

Lateral Force Mode

Dynamic Force Mode (Tapping Mode)

Phase Imaging Mode

Thermal imaging modes

Scanning Thermal Microscopy (SThM)

Magnetic properties

Magnetic Force Microscopy

Electrical properties

Conductive AFM (C-AFM)

Piezoelectric Force Microscopy (PFM)

Electrostatic Force Microscopy (EFM)

Kelvin Probe Force Microscopy (KPFM)

Scanning Spreading Resistance Microscopy (SSRM)

Mechanical properties

Force Spectroscopy

Force Modulation

Stiffness and Modulus

Adhesion

Unfolding and Stretching

Force Mapping

Other measurement modes

Lithography and Nanomanipulation

Electrochemical AFM (EC-AFM)

Applications

Flex-Axiom application examples

Topography of SrTiO₃ in dynamic mode

Strontium titanate (SrTiO₃, STO) is an oxide of titanium and strontium exhibiting a perovskite structure. It has interesting and partly unique material properties. It is used as substrate for growth of oxide-based thin films and high-temperature superconductors.

STO forms surfaces that show a layered structure. The thickness of individual layers is in the range of a few Angstrom. Atomic force microscopy is an ideal tool to image and measure these structures.

AFM topography showing steps of strontium titanate

Topography showing steps of strontium titanate; image size 1.1µm

Section profile and height distribution

The sample clearly shows the typical layer structure STO. Here, the layers are not perfectly smooth, but exhibit residual roughness of approx. 125 pm (RMS). This is caused by a non-ideal termination process during the preparation of this STO sample.

The graph shows the profile of the image shown above along a line extending from the top left to the bottom right corner of the imaged area. The profile also clearly shows the layered structure of the sample and reveals step heights of approx. 4 Å. Similarly in the right panel, the height distribution histogram of the image above clearly shows approx. 4 Å-spaced peaks for the different layers of the sample.

Topography and KPFM of CVD grown molybdenum disulfide monolayers

In this application note, monolayer MoS₂ grown by chemical vapor deposition (CVD) was imaged with Kelvin probe force microscopy (KPFM) using a Flex-Axiom to study the contact potential difference variation on a single crystal.

Monolayers of MoS₂ were grown on a silicon substrate by chemical vapor deposition (Sample courtesy: University of Illinois – Urbana-Champlain).

Non-uniformity of the contact potential signal across the monolayer can inform about doping profiles and other surface defects.

MoS₂ monolayers optical micrograph

a) AFM topography image of single MoS₂ monolayer. Location where profile is taken indicted by red line.
b) Height (top) and KPFM voltage (bottom) profile across monolayer

Measurements using the Flex-Axiom show a step height of 0.6 nm for the MoS₂ monolayer. Concurrent KPFM measurements show a 650 mV contact potential difference between the monolayer and the SiO₂ substrate.

3D AFM topography overlay MoS₂

All measurements were performed using a Flex-Axiom system equipped with a ANSCM-PA cantilever from AppNano. Images were processed using MountainsMap SPM.

For more information contact our application scientists

KPFM and MFM on stainless steel

In the experiment shown below, KPFM and topography data were recorded in a single run using a Flex-Axiom system. Also see the related MFM application.

KPFM overlay on a topography image of stainless steel
Scan size: 80 µm x 80 µm
Potential range: 200 mV

The topography image itself
Scan size: 80 µm x 80 µm
Height range: 50 nm

MFM image of the same area
Scan size: 80 µm x 80 µm
Phase range: 10°

Options & Accessories

Modular design: the most flexible system available

With a modular stage concept and various possible cantilever holder types, the Flex-Axiom is ready for all your current and future needs.

Sample stage 204

Simple stage with sample holder, fits on Isostage 300

Micrometer translation stage (shown on sample stage 204)

Manual sample positioning with 13 mm x 13 mm xy range, 10 μm positioning accuracy

Motorized translation stage 204

Motorized xyz sample positioning with 32 mm x 32 mm x 5 mm xyz range
Automated measurements using stage control, scripting and batch manager

Electrochemistry stage ECS 204

Perform in situ surface characterization under potentiostatic or galvanostatic control
Sample bath constructed of chemically inert materials

Sample stage for inverted microscopes

Available for Zeiss, Nikon, Olympus, Leica
Parallel AFM and optical image axes

Height extension for FlexAFM sample stage

For measuring higher samples
Each kit contains spacers to lift the scan head by 8 mm

Isostage 300

Active vibration isolation
Spike-Guard: detects anomalies and automatically rescans the line

Acoustic Enclosure 350

For use with FlexAFM systems with or without Isostage active vibration isolation table

Cantilever holders

With / without alignment grooves for topography in air and liquid, for electrical measurements, for FluidFM® and for SThM

View in webshop

FlexAFM video camera

Simultaneous top and side view:
5 MP, 1.5x1.1 mm, color top view and
5 MP, 3.2x3.2 mm, color side view of sample and cantilever
More comfortable sample positioning and approach

Environmental control option

Sample measurements under controlled, dry and/or inert gas atmospheres

Software options

Advanced imaging
Advanced lithography option
Advanced modes option
Advanced spectroscopy package
Cantilever calibration option
KPFM work package
PFM work package
Scripting interface option
Signal I/O option
Stage control option

View in webshop

FluidFM® upgrade

An enabling technology for micro-manipulation of single cells and other small objects, surfaces and tissues

Nanofluidics through a hollow cantilever combined with the positional accuracy and force control of the Nanosurf FlexAFM
Specialized application modules for different applications as injection, pick-and-place, adhesion force spectroscopy, elasticity measurements, and spotting
Suitable for stand-alone setup and on the inverted microscope

Flex-ANA upgrade

Nanomechanical tissue diagnostics and soft material analysis

Fully automated measurements on rough and non-even surfaces
Quantitative analysis of tissues and soft materials alike
Fast, objective, and routine sample categorization

Specifications

Flex-Axiom specifications and dimensions

System specifications

FlexAFM 5 scan head specifications with C3000i controller	100-µm scan head	10-µm scan head
Sample size	Unlimited without sample stage 100 mm on sample stage
Maximum Petri dish height (fluid level)	9 mm (6 mm)
Manual height adjustment range	6 mm
Motorized approach range (at tip position)	2 mm
Max. scan range (XY)	100 µm¹	10 µm¹
Max. height range (Z)	10 µm²	3 µm¹
XY-linearity mean error	< 0.1%
XY-flatness at maximum scan range	typ. 5 nm	typ. 1 nm
Detector bandwidth	DC - 4 MHz
Detector noise level (RMS)	typ. 60 pm / max. 100 pm ^{(3, 4)}
Z-sensor noise level (RMS)	typ. 180 pm / max. 200 pm ⁽³⁾
Z-measurement noise level (RMS, static mode in air)	typ. 100 pm / max. 200 pm
Z-measurement noise level (RMS, dynamic mode in air)	typ. 35 pm / max. 50 pm
Scan head dimensions	413 x 158 x 53 mm
Scan head weight	1.25 kg
(1) Manufacturing tolerances ± 5% (2) Manufacturing tolerances ± 10% (3) Measured at 2 kHz (4) Measured with XYContr cantilever

C3000i controller — Core hardware specifications
X/Y/Z-axis scan and position controller	3× 24-bit DAC (200 kHz)
X/Y/Z-axis position measurement	1× 24-bit ADC (200 kHz)
Excitation & modulation outputs	2× 16-bit DAC (20 MHz)
Analog signal input bandwidth	0–5 MHz
Main input signal capturing	2× 16-bit ADC (20 MHz) 2× 24-bit ADC (200 kHz)
Additional user signal outputs	1× 24-bit ADC (200 kHz)
Digital synchronization	Sync Out 1/2: digital outputs, signal range 0/5V TTL pulses
FPGA module and embedded processor	ALTERA FPGA, 32-bit NIOS-CPU, 80 MHz, 256 MB RAM, multitasking OS
Communication	USB 2.0 Hi-Speed to PC and scan head interface
System clock	Internal quarts (10 MHz) or external clock
Power	90–240 V AC, 70 W, 50/60Hz

Cantilever
Width	min. 20 μm
Length	min. 40 μm
Reflective coating	Reflective coating recommended
Liquid measurements	Yes, with gold coating
Alignment grooves	Required by default Special cantilever holders without alignment grooves are available
Resonance frequency dynamic mode Easyscan 2 Controller	15 kHz to 350 kHz
Resonance frequency dynamic mode C3000 Controller	< 4 MHz
Cantilever shape	Single rectangular cantilevers and multilever cantilevers (depending on scan head version and cantilever holder)
Chip thickness	300 μm, 500 μm or 600 μm depending on cantilever holder

The most flexible AFM for materials research

Overview

The most flexible atomic force microscope for materials research

Used by hundreds of researchers for many applications

The precision and performance you need for your research

Perfect for use inside a glovebox