Explore the forefront of nanoscale electrical characterization with our white paper on electrical Atomic Force Microscopy. This guide offers a comprehensive overview of electical AFM techniques, including the conductivity analysis of Conductive AFM, the surface potential insights of Kelvin Probe Force Microscopy, the material properties investigations of Piezoresponse Force Microscopy, and the permittivity and dielectric measurements afforded by Scanning Microwave Microscopy.