Explore the forefront of nanoscale electrical characterization with our white paper on electrical Atomic Force Microscopy. This guide offers a comprehensive overview of electical AFM techniques, including the conductivi...

Dive into the fascinating world of neuromorphic computing and discover how artificial spin ice structures are revolutionizing the way we think about computation. This application note offers an in-depth exploration of m...

HOPG topography recorded in static mode. XY-range: 3 nm, z-range 195 pm. Distance between visible atoms: 0.246 nm. No Fourier or Gaussian filtering applied.

This application note discusses the use of Dual-Frequency-Resonance-Tracking (DFRT) in Piezoresponse Force Microscopy (PFM). Piezoelectric materials generate an internal electric field when subjected to mechanical stres...

Bart Hoogenboom appointed new Head of R&D, bringing expertise in biophysics and advanced scientific instrument design

Semimetals are a wide range of materials filling the gap between classical metals and semiconductors. Unlike in semiconductors, in a semimetal the conduction and valence bands have a small overlap, but similarly to semi...