NaniteAFM — The smallest AFM for custom integration
Ideal for custom integration Automate serial measurements Copes with large, heavy, or curved samples
The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with least restriction to the sample dimensions.
The NaniteAFM has a tip-scanner, two inspection video cameras and an on-board approach motor in an exceptionally small footprint. It contains everything needed to operate independently, paving the way for easy integration: All you need is 300 cm3 in space and a stable docking site to mount the AFM.
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Save time thanks to optimized ease of use
The NaniteAFM uses a dovetail mounting plate at the back to allow quick and reproducible mounting. The use of cantilevers with alignment grooves makes laser alignment unnecessary. For integration this guarantees a well-defined offset between the cantilever tip and other components of a setup, for example an indenter. This exceptional accuracy allows switching between the components without searching for the right area, thus reducing off-time and handling during experiments.
The integrated topview camera with 2 µm lateral resolution gives a perfect overview of the surface to localize the areas of interest on the sample and position them under the cantilever. The convenient sideview camera shows the sample under the cantilever at an angle of 45 degrees. It guides the user during the initial fast approach to within a few tens of micrometers of the sample before the AFM takes over for the final automatic approach.
Topview/sideview camera images (1 and 2), optical and AFM image of indent (3 and 4)
Automation of measurements and analysis
To further minimize the operator time, NaniteAFM can be automated. Through the use of a scripting interface and batch measurement procedures, it is possible to automatically approach and measure samples. The analysis and report generation can also be automated using pre-defined pass-fail criteria. This is particularly powerful in combination with a motorized stage, so multiple areas of a sample or multiple samples can be measured autonomously without operator interference.
The integration capability allows NaniteAFM to handle virtually any sample. Large or heavy samples are no problem, because the NaniteAFM moves while the sample remains in position. Depending on the type of sample, motorization is applied to the tip or the sample, or to both. If a standard solution is not available for your sample, a highly skilled team of engineers and scientists is available to design a custom solution that perfectly fulfils your requirements. Even measurements at different angles can be performed with the appropriate stage.
With automated measurements on large sample in mind, this high-load, high-precision, and low-noise translation stage pushes the boundaries of sample stage performance. A pneumatic lift/lock mechanism ensures easy travel when lifted and stable measurements when locked. Large travel ranges and heavy-duty integrated active vibration isolation complement the setup.
This custom-built translation stage was constructed to allow roughness measurements on large concave and convex samples. It features full 360° manual rotation of the sample platform and automated rotation of the scan head to accommodate the curved form of the various samples. Learn about other projects we have realized in the custom solutions section.
Quantitative surface analysis at the nanoscale
NaniteAFM is the optimal tool to enhance your imaging and analysis capabilities for quality control, providing nanoscale surface information. It has the advantage that it works equally well for opaque and transparent samples. Because of the latter, AFM has become a well established technique for surface analysis of glass. Some applications require glass surfaces exhibiting a roughness well below the nanometer, and nanometer-sized defects may affect the object's behavior. Despite their surface smoothness, glass objects can be large and heavy, and it is undesirable to cut out samples from a work piece for examination. Finally, glass surfaces are not necessarily plane-parallel, like in the case of lenses. The NaniteAFM is a flexible tool that can handle all requirements to obtain quantitative surface information of a glass work piece.
Image (A) and statistical analysis (B) of a glass surface with sub-nanometer roughness (00584)
Image (A) and height profile (B) of nanoscale ripples in glass. The ripples are produced by physically removal of atoms from the surface using defocused ion beam sputtering with inert Ar ions. Sample courtesy: Maria Caterina Giordano and Francesco Buatier de Mongeot, Dipartimento di Fisica, Università di Genova (Italy) (00787)
In parallel to the topography you can visualize other material properties with NaniteAFM: phase information can be used to observe heterogeneity of tip-sample interaction if samples exhibit variations in elastic, adhesive or magnetic properties at the nanoscale. For polymeric samples, the local elasticity and adhesion properties can also be mapped quantitatively in static spectroscopy mode.
Overlay of phase on topography, uncovering variation in mechanical properties of rubber, with a higher phase in green-red on particles compared to the surrounding matrix in blue.
Overlay of phase on topography, displaying the magnetization of a Permalloy thin film (sample courtesy: Prof. Dr.-Ing. Jeffrey McCord, Nanoscale Magnetic Materials - Magnetic Domains, Institute for Materials Science, University of Kiel).
NaniteAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please contact us.
Standard imaging modes
Static Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Electrostatic Force Microscopy (EFM)
Scanning Spreading Resistance Microscopy (SSRM)
Mechanical properties
Force Modulation
Force Spectroscopy
Force Mapping
Other measurement modes
Lithography and Nanomanipulation
Scan head dimensions
Applications
NaniteAFM application examples
Nanoindentation
Nanoindentation is one of the most important techniques for the quantitative characterization of mechanical properties of materials. Essentially it works by of pushing a hard, sharpened indenter tip with a well-defined shape against the surface of a sample. This tensile testing technique is used to precisely and locally characterize materials of all sorts (thin coatings, metals, ceramics, polymers, biomaterials etc.) at a nanoscale level, and can also be of great interest for heterogeneous surfaces (different phases, porous materials, depth sensing, defects vs. intact surface, etc.). By analyzing force-displacement curves, it is possible to extract sample hardness and elastic modulus without measuring the residual imprint as it is done with conventional macroscale hardness techniques.
As a challenge, the rule of thumb says that the depth of penetration should not exceed 10% of the coating’s thickness to avoid influences of the underlying substrate. For a 1-μm thin film, this corresponds to a maximum indent of 100 nm. Moreover, to avoid the influence of surface roughness on the measurement, it should be smaller than 20% of the indentation depth. For a roughness of 10 nm, the minimum depth of indentation should therefore be 50 nm.
Nanoindentation and atomic force microscopy (AFM) can be coupled in a single system with an accurate repositioning stage to allow a comprehensive and (semi)automated analysis. In a first step, the atomic force microscope measures surface roughness to help define the minimum indentation depth. Then the sample is precisely positioned under the nanoindenter to perform a mechanical analysis on the same location. In a last step, this location can again be moved under the AFM to characterize and understand stress-induced features such as material pile-up, sink-in, or cracks induced around the indentation. If observed, these effects might have an influence on the values obtained for hardness and elastic modulus.
Analyzing large surfaces using AFM stitching
This application describes the automated stitching feature of the Nanosurf Nanite AFM scripting interface in combination with the Nanosurf Report Expert analysis software. AFM
measurements on an LCD panel are used as an example to demonstrate how stitching can thus be used to easily and efficiently generate highresolution topography maps of large surface areas.
High resolution imaging techniques like AFM are often limited in their maximum scan range. When both the high lateral resolution of an AFM and a large scan range are required, image stitching could be a solution. Image stitching is commonly used when creating a single panoramic scene from multiple pictures. In a more advanced implementation, this technique can also be used to combine multiple AFM measurements to a single large image. Thus, AFM imaging of large surface areas, e.g. 1 mm × 1 mm or 100 µm × 1 cm in size, can easily be achieved.
Scan range 700µm x 700µm; Z range 2µm
The Nanosurf Nanite AFM system is able to measure and stitch the required images fully automatically. The user only has to specify the single AFM image size and the size of the area to be measured. The AFM then takes care of the rest. After measurement, the images are loaded into the Nanosurf Report Expert postprocessing software, and are stitched together to a single image. This image still contains all metrological data and can therefore be analyzed like any other AFM image with all available analysis functions, including height and distance measurements, roughness calculation, grain and particle analysis, cross section analysis, and of course 3D visualization.
NaniteAFM image gallery
Magnetic force microscopy on polished stainless steel
Dynamic mode AFM of polished sapphire
AFM force spectroscopy on a polymer blend
AFM phase image of a polymer blend
Topography analysis of ePTFE membrane using AFM
Magnesium fluoride coating
Tissue samples
Polycarbonate gratings
Airplane Wing Coating
Treated Nanofibers
Photoresin Interference Grid
CD
Copolymer
Nanosphere Lithography
Polymeric glass
Lithography on Titanium
Topography of solar cell layers
Screw dislocations in GaN
Dynamic mode AFM on pentacene film on TiO2
Morphology analysis of paper
Contact mode AFM of polished ceramic plate used in dentistry
Dynamic mode AFM of human hair
MFM of bits on a harddisk
AFM image of quantum dots
AFM images of gold film on ceramic grains
AFM for dental implants
AFM image of butterfly wings
Static force AFM of stainless steel
Options & Accessories
NaniteAFM options and acccessories
Quick-lock mounting plate
The dovetail mounting plate for the NaniteAFM is an easy way to integrate the AFM into your setup. It is equipped with a quick-lock for fast assembly and reproducible mounting.
Sample stage 204
Dimensions: 139,1 mm (h) x 204 mm (w) x 204 mm (d)
Sample stage to accommodate the NaniteAFM scan head, mountable on the Isostage.
Isostage 300
Vibration-free measurements with the Nanosurf Isostage
XY micrometer translation stage
Manual translation stage for used together with the Nanite sample stage
travel distance: 13 mm
XY resolution: <0.5µm
ATS 204 automated translation stage
For small samples and travel ranges, Nanosurf developed the ATS 204 automated translation stage for NaniteAFM-based AFM systems. This compact translation stage, which is fully compatible with the Nanosurf Isostage vibration isolation table, represents a simple starting point for automated serial measurements. Controlled via the convenient Nanosurf stage control unit and the Nanosurf batch manager (integrated in the Nanosurf control software), the ATS 204 allows for easy operation, programming, and measurement execution. No attendance or supervision is required for otherwise time-consuming and repetitive tasks.
Description
Specification
Max. traverse path XYZ
32 mm; 32 mm; 5 mm
Add. manual Z adjustment
30 mm
Step size XYZ
50–1000 nm
Resolution XYZ
0.1 µm
Repositioning accuracy
σ = 1 µm
Absolute accuracy
± 10 µm
Max. velocity
13 mm/s
Sample platform size
36 × 36 mm
Sample weight
max. 200 g
Stage size
204 × 204 × 240 mm
Stage weight
5 kg
Stage technology
Piezo stick-slip motors
Software
Control software
The control software for Nanosurf AFMs is an intuitive platform made for performing your AFM measurements efficiently and easily. Our Service team and software engineers are constantly developing and implementing new features and enhancements to further improve the user experience. We regularly publish new and improved versions, which you can download for free. You can install the software on as many computers as you wish to analyze your data.
Free lifetime updates: download all software updates for free
All software updates for Nanosurf control software are free of charge. Our software team is constantly working on new features and improvements to make the user experience better, more intuitive and more efficient.
Software features
Automatic/parameter-free frequency tuning based on cantilever characteristics
Simply choose the cantilever you are using, and the system automatically performs the frequency sweep prior to approaching the sample. No manual setting of parameters is required.
Distance measuring tools: measure the distance between points or lines, the height of features, and more
A selection of different measuring tools allow you to accurately measure angles and distances directly on the acquired measurement image.
Determine the distance between two points or between two parallel lines to make very precise measurement (as shown in the video).
Integrated stage control for various motorized stages
The software lets you control your motorized stage out of the box. Load your stage's configuration file and you are ready to move the stage out of the software, either using arrow buttons, or by entering precise cantilever positions on the sample.
More convenient usability features:
Spectroscopy wizard: follow easy steps to set up spectroscopy measurements
One software UI for all scan heads: no additional learning curve if you use multiple Nanosurf AFM systems
Automated deflection calibration
UI layouts for beginners and advanced users
Highly configurable graph area with mode-dependent auto-layout: the software automatically shows the relevant graphs and information
Easy file handling with comfort features: auto apply naming conventions, Windows Explorer integration, image gallery, bulk renaming.
Includes a powerful scripting interface: automate and extend capabilities according to your needs. Compatible with most programming environments (e.g. LabView, Python, MatLab, C++, Java, and more)
